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PPMA Show 2020

NEC, Birmingham(B40 1NT)

29/09/2020 - 01/10/2020

PPMA Show 2020 is the UK’s largest ever event dedicated to state-of-the-art processing and packaging (more)

Advanced Engineering 2020

NEC, Birmingham(B40 1NT)

04/11/2020 - 05/11/2020

The UK's largest annual advanced manufacturing trade show, Advanced Engineering is your opportunity to (more)

Drives & Controls Exhibition

NEC, Birmingham(B40 1NT)

25/01/2021 - 27/01/2021

The show brings together key suppliers of state-of-the-art equipment representing the multi-tasking culture (more)

The utmost flexibility in R&D analysis

So that its customers get the best possible return on investment from its top of the range SC600 thermal imaging cameras, Flir Systems has announced upgrades that substantially increase the scope of their application. This has been achieved in part by features such as high speed windowing, panorama image building with full radiometric data, and a new autofocus laser pointer. New wide-angle and macro lenses have also been introduced. To complement this enhanced functionality, however, Flir Systems has also developed a classy new R&D software package, Flir ResearchIR.

This sophisticated new software is aimed at the more advanced thermographer who needs to monitor thermal events that are typically more agile or transient. "This is a premier data analysis product," explains UK sales and marketing manager Paul Sacker. "It provides extremely tight control of the camera and its interfaces for pre- and post-triggering."

Flir ResearchIR visualises thermal patterns and applies advanced start/stop recording capabilities such as pre- and post-recording and high-speed image storage. It also allows prost-processing of recorded IR-image sequences of dynamic thermal events. Analysis functions include spot, line/polyline, area and ellipse. It creates time-temperature plots of the event, exporting them in standard picture and data formats for subsequent analysis - particularly beneficial for industrial, R&D, automation and process control.
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