Kistler jBEAM delivers efficient measurement data analysis for automotive R&D

The Kistler JBEAM solution presents a highly flexible system that can be configured to precisely meet the demands of diverse applications. Intelligent data analysis recognizes patterns and identifies relationships with data evaluation tailored to specific measurement needs. System flexibility allows the creation of individual user interfaces and reports with scaling to maintain computing capacities in line with demand and requirements. Networking delivers globally managed measurement data whilst the special MDFS file system guarantees data integrity.

Kistler is well known for manufacturing precision sensors but delivering measurement data with the highest accuracy is only part of the story; data analysis of the same quality is essential to make the data useful. Whatever the reason for data collection, jBEAM interactively analyses the data quickly and efficiently and saves time by automatically creating reports in a wide range of standard file formats.

A complete system from day one but over time, as new features are implemented in response to user feedback and application requirements, jBEAM will evolve to meet the developing needs of the automobile industry.