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PPMA Show 2021

NEC, Birmingham(B40 1NT)

28/09/2021 - 30/09/2021

PPMA Show 2021 will be the UK’s largest ever event dedicated to state-of-the-art processing and (more)

Southern Manufacturing

Farnborough, Hants(GU14 6TQ)

06/10/2021 - 07/10/2021

Southern Manufacturing and Electronics is the most comprehensive annual industrial exhibition in the (more)

Advanced Engineering 2021

NEC Birmingham(B40 1NT)

03/11/2021 - 04/11/2021

Join us in our 12th and most important edition to date, as we invite engineers and management from all (more)

First online Pan-European Automated Test Summit

National Instruments is hosting what it describes as the first online Pan-European Automated Test Summit, which will feature technical sessions on identifying trends and overcoming new challenges in automated test. The Pan-European Automated Test Summit is a free, full-day event hosted live on the Internet on 27 November 2007 at 09:00 GMT. During the summit, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area. This event will be available on demand for 30 days after the live event.

Francis Griffiths, NI Vice President of Sales in Europe, comments: "National Instruments is excited to be working with technology leaders and ATE to present the latest test strategies and technologies addressing challenges faced by test engineers and senior managers from leading electronics manufacturers. To make the summit more accessible to engineers facing increased workloads, NI is hosting the event online so engineers can learn the best practices in test development at their convenience."

Representatives from companies such as Averna, Flextronics Sweden, Intel, Microsoft, National Instruments and Texas Instruments will share their technical expertise and best practices during the event. Additionally, NI Business and Technology Fellow Mike Santori will open the event with the keynote Developing Next-Generation Test Systems, and Marvin Landrum, Automation Infrastructure Manager at Texas Instruments, will present the afternoon keynote Strategies for Developing a Global Test Program.

 

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